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::: 可授權專利

Radiation test system

創作型式:
專利證號:
US6456084B1
發明人:
Wu, Kuang Shyr | Lin, Maw Ching | Juhn, Li Shen
國別:
美國
獲證日期:
2002-09-24
專利摘要:
A radiation test system that couples with a radiation test field and a radiation controller. The radiation controller records the flow of radiation particles and the test results obtained from a test component. The radiation controller also controls a radiation particle accelerator so that the test component is irradiated with a cyclically varying radiation beam. The radiation test system further includes a daughter board, a motherboard, a power source, a near-end monitor and a far-end monitor. The near-end monitor is responsible for initiating a test program to test the test program, monitoring the test status and recording the test data. The far-end monitor remotely controls the near-end monitor to initiate an irradiation testing of the test component. The far-end monitor also receives test data submitted by the near-end monitor so that test results may be further analyzed.
IPC國際分類號:
G01R003130 | G01R003100 | G21K000500