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Compensating chemical mechanical wafer polishing apparatus and method
發明人：
Lai, Jer Shyong | Pan, Wen Chueh | Fann, Yang Jiann | Wang, Yih Hsing | He, Chien Cheng | Hsu, Chaug Liang
專利摘要：
A compensating chemical mechanical wafer polishing apparatus and its related polishing method, which makes end point detection easy, minimizes slurry consumption, and requires less installation space and, in which a main polishing head of diameter smaller than the wafer and a compensating polishing head are used to polish the wafer, which is upwardly disposed in contact with the polishing heads. By means of the operation of the compensating polishing head to polish the wafer over the area where the main polishing head cannot effectively evenly polish, satisfactory polishing effect is achieved.
IPC國際分類號：
B24B000730 | B24B002904 | B24B003704 | B24B0053007 | B24B005702 | H01L0021304 | H01L0021469 | H01L0021306
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