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::: 可授權專利

一種天線陣列故障檢測及天線自校的方法 (System And Method For Array Antenna Failure Detection And Antenna Self-Correction)

創作型式:
發明
專利證號:
US10063327B2
發明人:
陳君豪、張博淳、黃亮儒
國別:
美國
獲證日期:
2018/08/28
專利摘要:
System and method for array antenna failure detection and antenna self-correction are introduced. In the array antenna failure detection and antenna self-correction system, a signal analyzer is employed to perform gain analysis so as to perform gain attenuation/compensation, and a DC offset generator is employed to generate a set of known offset amounts which are added to signals, so that, at the receiving end, a phase offset amount can be derived based on comparisons with the original signal, and antenna correction can then be performed accordingly. In this way, computational complexity of the system can be reduced, and the speed of antenna correction can be increased.
IPC國際分類號:
G01R002908