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論文
【年度】99
年研發成果
【項目】
論文
【領域】
關鍵技術科專
【類別】
電資通光
計畫名稱 | 光電感測辨識模組與應用技術計畫 | 論文名稱 | A novel positioning method for optical automatic inspection of an LCD assembly process | 論文類型 | 期刊 | 發表處 | Optik 121 (2010)1089-1095 | 發表人 | Chern-Sheng Lin, Su-Chi Chang, Yun-Long Lay, Mau-Shiun Yeh, Chi-Chin Lin | 發表日期 | 99/06/01 | 國家 | 國外 | 內容摘要 | In this paper a new marker alignment method is applied to the fabrication process of FPC positioning bonding, and sample comparison technology applied to the combined fabrication process of TFT-LCD. After the first linear regression method, filtration process, and second linear regression calculation, the central coordinate of the positioning marker can be obtained. The compensation method carries out sample point mapping compensation through parallelism or perpendicularity between the middle line and boundary line. This method can effectively avoid the positioning error produced by flaws in image taking process or poor image quality. This positioning method not only applies to the single image, but also could precisely position two images. In the future, it is expected this positioning method can be combined with positioning machine, and conduct positioning online. |
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